Seeds & Needs Seminar
Schedule
Seeds & Needs Seminars are the presentations by exhibitors to introduce cutting edge technologies.
(visitors; Admission Free)
(visitors; Admission Free)
| Seeds & Needs Seminar A | |||
| Feb.15(Wed.) | Feb.16(Thu.) | Feb.17(Fri.) | |
 10:30～11:15 |
Technology Research Association for Single Wall Carbon Nanotubes The Current State of Development of Single Wall Carbon Nanotube Composite Materials and Their Product Samples |
Nagoya Institute of Technology / Chemical Engineering Laboratory Deforaming from highly viscous fluids |
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11:30～12:15 |
Osaka Municipal Technical Research Institute Osaka Municipal Technical Research Institute "Advanced nanotechnology for industry" |
Asylum Technology Co., LTD. Loss Tangent Atomic Force Microscopy of Polymer Materials |
Ashizawa Finetech Ltd. Refinement Technologies for Nano Particles by Agitator Bead Mills |
| 13:00-13:45 | Nara Machinery Co., Ltd. Composite materials and surface modification using nanoparticles |
AIMEX CO., LTD. Low-cost and high efficiency dispersion by Alpha-Mill |
NIKKISO CO.,LTD. Leading-adge technology for nano particles -"Nanotrac Wave" a new model line of MICROTRAC- |
| 14:00-14:45 | Institute for NanoScience Design, Osaka University Nanoscience & Nanoengineering Design and Nanotechnology Talent Fostering |
NETZSCH-Feinmahltechnik GmbH (Ashizawa Finetech Ltd.) New Generation of Grinding Media Separation in Agitator Bead Mills |
OTSUKA ELECTRONICS CO.,LTD. New approach of particle characterization by light scattering technique |
| 15:00～15:45 | Okayama University |
KURARAYKURAFLEX CO.,LTD. Development of novel nonwoven fabrics utilizing KURARAYKURAFLEX's nano control technology |
TOYO Corporation Surface analysis with "Low Voltage FE-SEM" and "in-situ SPM/AFM" |
| 16:00～16:45 | SHOKO SCIENTIFIC CO.,LTD. Semi preparative and high resolution particle size distribution analysis using FFF method for nano particles. |
Bruker AXS K.K. Challenging the new possibilities with AFM technology -Characterization of mechanical property, electrical property, collaborate with Raman and Environmental control- |
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| Seeds & Needs Seminar B | |||||
| Feb.15(Wed.) | Feb.16(Thu.) | Feb.17(Fri.) | |||
11:30～12:15 |
SHIMADZU CORPORATION Multidimensional Evaluation on nano-material and related samples using a variety of analytical and measuring methods |
NANOMETER STANDARD GmbH ※Simultaneous Interpretation(Japanese - English) Systems for calibration and measurement in nanometer range with subnanometer uncertainty |
Iran Nanotechnology Initiative Council (INIC) Iran Nanotechnology Initiative, Program and Achievements |
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| 13:00～13:45 | Nanotechnology Business Creation Initiative (NBCI) Nanotechnology Seeds-Needs Seminar (NBCI 46th NANOBIZ-MATCH) |
Nanotechnology Made in Germany ※Simultaneous Interpretation(Japanese - English)
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The State of Illinois Tokyo Office Nanotech Industries in Illinois
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| 14:00～14:45 | Institute of Advanced Energy, Kyoto University + Eco-topia Science Institute, Nagoya University Advanced experimental equipment of universities is now open to private sectors(free trial use may be applicable) |
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| 15:00～15:45 | Advanced Softmaterials Inc. SeRM Superpolymer/Elastomer Using Slide-Ring Material and Their Function and Application |
JFE Techno-Research Corporation Most Advanced Technologies to Characterize fine structure of Nano-Materials |
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| 16:00～16:45 | Malvern Japan Division of Spectris Co., Ltd Introduction of New Product"Next Generation of Rotational Rheometer, Kinexus" and its application to dispersion/colloid/emulsion |
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| Seeds & Needs Seminar C | |||
| Feb.15(Wed.) | Feb.16(Thu.) | Feb.17(Fri.) | |
11:30～12:15 |
Kyowa Interface Science Co., Ltd. Evaluation method by means of interfacial science technology to optimize the characteristics required in entire wet processes of coating.. |
SURTECH |
Japan New Diamond Forum Present Status of Standardization of Diamond-Like Carbon Coating |
| 13:00-13:45 | SURTECH | SURTECH | SURTECH |
| 14:00～14:45 | Meiritsu Component Co., LTD Development of Goods Using ω-STAR |
Kyowa Interface Science Co., Ltd. Zeta Potential Measurement of Concentrated/Diluted Samples～Dispersion Treatment Control and Examples of Particle Observation～ |
Japan Plating Suppliers Association |
| 15:00～15:45 | SHOKO SCIENTIFIC CO.,LTD. Particle Size Distribution Measurement which can Provide Quantitative Information on the Stability of a Nanoparticle |
MITSUBISHI ELECTRIC CORPORATION New Coating Technology "MSCoating" |
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| 16:00～16:45 | SURTECH | Kyowa Interface Science Co., Ltd. ＜New Technique＞ Optimal evaluation method for adherencefrom the light to heavy peel strength with multi-acceptable peel angles. |
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* Seminar titles and contecnts are subject to change.
For Exhibitors
- Target
- ： All exhibitors (including concurrent exhibitions)
- Fee
- ： 1 session - 45 minutes
*Please choose date & time on the schedule. - ： A/C ￥157,500 (tax included)
- ： B ￥283,500 (tax included) *With Simultaneous Interpretation
Price includes
(1) Space for presentation,100 seats
(2) Screen & Projector for computer-based presentations
*Personal computer should be provided by exhibitor.
(3) Audio equipment (2 microphones, Speaker)
*Exhibitor should do the progress management of the seminar.
*Simultaneous interpretation system will be provided for S & N seminar B only.
*Exhibitor is allowed to distribute materials and conduct survey.
Application
Please choose session date & time for presentation. The application will be accepted on first-come first serve basis.
Please send the application form 
to the secretariat by FAX.
